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Software Quality Measurement: A Framework for Counting Problems and Defects

Software Quality Measurement: A Framework for Counting Problems and DefectsISBN:9995440458
Pages:0
Date:1992-10
Publisher:Research Access Inc
Rating:5.0

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Reviews From AMAZON.COM


A decade old, but remains a definitive work


This SEI technical report formed the foundation for the author's 1999 book titled "Measuring the Software Process" (coauthored with Anita D. Carleton; ISBN 0201604442).

Where the later book focused on measurement techniques that spanned the entire development life cycle, this one is confined to the narrower topic of defects. What I like about this book, and why it isn't superseded by the later one, is the way it comprehensively covers all phases of defect management. The chapters are sequenced as follows: (1) a short introduction that covers the book's scope and discusses problems and defects within the context of software engineering environments, (2) a framework for counting problems and defects, (3) problem and defect attributes, (4) an example defect problem count definition checklist, (5) an example problem count request form, (6) an example problem definition status form [Note that reproducible forms for the examples given in 4 through 6 are provided in Appendix C], (7) a summary of the framework for counting problems and defects that tie together the preceding chapters. Chapter 8 provides recommendations that are more fully explored in the 1999 book I cited above, Appendix A is a glossary that is valuable to anyone new to measurement practices, and Appendix B is a collection of examples of how to use measurement results - Project Tracking-System Test, Tracking Customer Experience, and Improving the Software Product and Process.

If you are a member of an SQA team or PMO, or are involved with product quality improvement I strongly recommend this book as an introduction to problem and defect counting. The framework is well thought out, and the in-depth discussion of all facets of the topic represents one of the most complete and focused despite the fact that this technical report was written over a decade ago.

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